Infrared thermal imaging cameras in the medium and long wavelength bands play an important role in the national defense and security departments. For thermal imaging camera manufacturers, maintenance units, scientific research institutes and end users, the testing of thermal imaging cameras is important. significance.

Provides test systems to meet different infrared camera test requirements:
-SIM system (simplified measurement of laboratory environment and long-distance reconnaissance / scientific research-level thermal imaging camera)

The SIM system is a simplified test system for infrared thermal imaging cameras, mainly based on resolution and focus testing.

The DT test system is based on the extremely high-precision TCB blackbody to test the parameters of the infrared camera. The system provides accurate testing and evaluation of a series of parameters of the infrared camera. However, due to the relatively high price of the DT test system, we Designed and produced a relatively simplified and low-cost SIM test system for testing resolution, relative sensitivity, infinite focus and axis calibration.
The SIM150 test system is based on projecting the radiation generated by the SIM50 blackbody through the image of the manually replaceable infrared target to the infrared thermal imager under test. The standard image is collected by the system acquisition card and then analyzed and calculated by professional analysis software to obtain the tested parameters. The system consists of three main parts: CDT15150SR off-axis reflective collimator, SIM50 black body including CSIM50 controller and a set of infrared targets.

Principle block diagram of SIM test system	IR USAF1951 target

· SIM system module

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