培训会 | 工业视觉EMVA 1288标准

EMVA 1288课程线上培训会

EMVA 1288的全称是European Machine Vision Association 1288，其标准用于分析和测试与工业视觉相关的图像传感器及相机（线阵、面阵传感器，多种光谱波段），使得图像传感器与相机生产商有统一的性能测试标准作为参考。该标准严格通过物理参数来表现设备性能，介绍了量子效率，总增益，暗场噪声，饱和容量，绝对灵敏度（阈值），动态范围，最大信噪比，DSNU1288,PRNU1288和暗电流的客观评价标准，大大缩短测试&开发周期，提高图像传感器和相机的质量。

目前，EMVA 1288标准已被中国CMVU,美国AIA，日本JIIA，德国VDMA等各大相关的行业组织所接受与支持，是目前唯一在国际国内通用的图像传感器与相机性能测试的行业标准。

推荐阅读：EMVA 1288欧洲工业视觉标准解读

全新版本（Version4）将于2020年底发布并投入使用。本次培训课程包含：新版本的主要功能，包括不均匀性、非线性（HDR）相机、经过预处理的相机、通过镜头进行辐照的相机以及各种多模式传感器（UV、SWIR、多光谱、偏振、飞行时间）的拓展研究。

· 主讲人

Prof. Dr. Bernd Jähne HCI, Heidelberg University  ：1288标准化委员会主席

· 活动事宜

① 培训会时间：12月1-3日 13 : 00-18 : 00

② 培训会形式：线上培训

③ 培训费用：5000元/人

· 培训会课程内容

Day 1 (three 90 minute sections, with two 15 minute breaks)

I. Introduction

• Purpose, history of EMVA 1288 standard

• Comparison with other standards, especially the ISO standards and the upcoming IEEE standards P2020 for automotive sensors and P4001 for hyperspectral imaging

II. Foundation Imaging and Image Sensors

• Radiometry of imaging; radiometric quantities

• Functional units of image sensors and digital cameras

• Inner photo effect; photon conversion in image sensors; noise sources

• Elementary processes in solid state imagers: optical losses, recombination, diffusion, and charge storage

• Causes and types of nonuniformity

• Dark current and its temperature dependency; temperature dependency of other sensor parameters

III. In-depth Foundation of the EMVA 1288 Standard

• “Black box” model for linear and non-linear cameras; system theoretical approach

• Characteristic curve and photon transfer curve

• Signal-to-noise ratio (SNR) for input and output signa

• Causes and types of spatial nonuniformity; separation into column, row and pixel variation; total signal-to-noise ratio

• Dark current and its temperature dependency; temperature dependency of other sensor parameters

Day 2 (three 90 minute sections, with two 15 minute breaks)

IV. Optimal EMVA 1288 Measurements and Measuring Conditions

• Mandatory and optional measurements

• Choice of analysis between linear model (Release 4 Linear) or general model (Release 4 General)

• Dark current measurements

• Irradiation series for sensitivity, noise, and linearity; light sources, irradiation variation, and irradiation without and with lens

• Measurement and analysis of nonuniformity

• Spectral measurement

V. Practical Exercises

• Performing EMVA 1288 measurements with available test equipment, software, and cameras

VI. Standardized EMVA 1288 Data Sheet

• Cover sheet

• One-page summary

• Main part with all EMVA 1288 measurements and graphs

Day 3 (three 90 minute sections, with two 15 minute breaks)

VII. Analysis of all Measuring Curves, Deviation from Ideal Behavior, Accuracy of Parameters

• Characteristic curve (sensitivity measurement); estimation of slope by cubic B-spline regression

• Photon transfer curve: a sensitive tool to analyze deficiencies

• Input SNR curve

• Problem of too low dark noise (influence of quantization noise)

• Derived parameters and their precision, accuracy and reliability: quantum efficiency, absolute sensitivity threshold, saturation capacity, maximum SNR, dynamic range (DR)

• Non-linearity

• Horizontal and vertical profiles to characterize nonuniformities and defect pixels in one representation

• Defect pixels: flexible characterization of defective pixels using logarithmic histograms

• Spectrogram method (Fourier transform to detect periodic nonuniformities)

• Dark current and its dependence on temperature

• Spectral sensitivity and color qualitative: measuring and evaluating the spectral sensitivity, characterization of color quality

VIII. Tests for Correctness of EMVA 1288 Measurements and Model

• Cumulative histogram

• Stability analysis

• Pixel correlation: is there any preprocessing (noise suppression etc.)?

• Dependency of PRNU on saturation

• Dependency of PRNU on wavelength of irradiation

IX. Application-oriented camera selection

• What do we need to know about the application?

• Which of the EMVA 1288 parameters are the most important given certain application conditions?

X. Outlook Further Development of the EMVA 1288 Standard (Release 4.1)

• Dependency of sensor sensitivity and nonuniformity on f-number;

• Spatial resolution of image sensors (PSF and MTF)

• Color quality

△ 培训会将以英文进行讲解，参与培训人员后期会发送培训资料。

· 技术了解

EMVA提供了四个免费的30分钟在线讲座，感兴趣的工程师可以点击→「EMVA 1288在线讲座」

· 活动联系人：

（华北区）王凤云 13910990729

（华东区）任尽聚 15317911863
（华南区）王龙 15811259752

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