The CS-ECTS-TC29 Fluorescence Uniformity Test Chart is designed for evaluating image uniformity in Near Infrared Fluorescence (NIRF) camera systems operating at 800 nm (ICG) and 700 nm (MB).
Developed with a standardized target pattern and a resolution of 1 point/mm, it assists engineers and quality professionals in assessing fluorescence image uniformity, identifying illumination variations, and verifying imaging performance throughout product development, manufacturing, and quality assurance processes.
Its compact 80 mm × 54 mm format allows convenient integration into a wide range of NIRF imaging systems without requiring additional accessories.
Chart Specifications Parameters:
| Parameter | Fluorescence Uniformity Test Chart |
| Model | CS-ECTS-TC29 |
| Size |
40mm × 26mm |
| Chart Type |
NIRF-optimized fluorescent material |
| Test Wavelength Range | 700nm(NB)~ 800nm(ICG) |
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